TEM CHARACTERIZATION OF HIGH T(C) SUPERCONDUCTIVE MULTILAYERED THIN-FILMS

被引：2

作者：

ALIMOUSSA, A ^{[1
]}

CASANOVE, MJ ^{[1
]}

ROUCAU, C ^{[1
]}

VILLARD, C ^{[1
]}

SCHWERDTFEGER, M ^{[1
]}

DICIOCCIO, L ^{[1
]}

MORICEAU, H ^{[1
]}

VILLEGIER, JC ^{[1
]}

机构：

[1] DTA,LETI,DEPT OPTRON,F-38041 GRENOBLE,FRANCE

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1992年 / 14卷 / 04期

关键词：

D O I：

10.1016/0921-5107(92)90074-J

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Superconductive multilayered thin films have been deposited by excimer laser ablation and d.c. magnetron sputtering. The laser deposited films were grown on (100) SrTiO3 substrates and consisted of alternating layers of La2-xSrxCuO4 (LSCO) and YBa2Cu3O7-delta (YBCO) while the sputtered films, deposited on (100) MgO substrates, consist of a 3 nm MgO layer sandwiched in 100 nm YBCO layers. Cross-sectional transmission electron microscopy (TEM) specimen have been prepared so as to investigate the different interfaces and the local structure of the films. The results show that the laser deposited films are epitaxially grown with the c-axis normal to the surface. The interfaces are rather sharp but some roughness of the YBCO over LSCO interface, possibly related to the presence of shear defects in the LSCO layers is evidenced. The observations of the sputtered films reveal the presence of some a-axis oriented YBCO grains and th partial crystallization of the amorphous deposited MgO layer. Some a-axis oriented grains are also observed in the lase deposited films but only in the upper layers. The different types of structural defects as well as the different interfaces, characterized by high resolution electron micrsocopy (HREM), will be reported.

引用

页码：353 / 356

页数：4

共 11 条

[1] CROSS-SECTIONAL TEM INVESTIGATIONS OF THE MICROSTRUCTURE AND FILM-SUBSTRATE INTERFACE IN Y-BA-CU-O THIN-FILMS [J].