AUGER AND SECONDARY ELECTRONS EXCITED BY BACKSCATTERED ELECTRONS

被引：11

作者：

GOTO, K

ISHIKAWA, K

KOSHIKAWA, T

SHIMIZU, R

机构：

[1] NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN

[2] OSAKA UNIV, DEPT APPL PHYS, SUITA, OSAKA, JAPAN

来源：

APPLIED PHYSICS LETTERS | 1974年 / 24卷 / 08期

关键词：

D O I：

10.1063/1.1655215

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：358 / 359

页数：2

相关论文

共 14 条

[1] METHODS OF SURFACE STUDIES DEPENDING ON INELASTIC-SCATTERING OF ELECTRONS
BAUER, E
[J]. VACUUM, 1972, 22 (11) : 539 - 552
[2] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION
BISHOP, HE
RIVIERE, JC
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &
[3] BRONSHTEIN IM, 1960, SOV PHYS-SOL STATE, V1, P1365
[4] BRONSHTEIN IM, 1961, SOV PHYS-SOL STATE, V3, P1188
[5] BRONSHTEIN IM, 1960, SOV PHYS-SOL STATE, V1, P1375
[6] ESTIMATION OF BACKSCATTERING EFFECTS IN ELECTRON-INDUCED AUGER SPECTRA
GALLON, TE
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (04) : 822 - &
[7] METHOD OF DETECTING FINE-STRUCTURE IN SECONDARY-ELECTRON EMISSION YIELD AND APPLICATION TO SI(111)
GOTO, K
ISHIKAWA, K
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 1559 - +
[8] COMPACT INEXPENSIVE HIGH-RESOLUTION RETARDING FIELD ENERGY ANALYZER
GOTO, K
ISHIKAWA, K
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (03) : 427 - &
[9] SECONDARY ELECTRON EMISSION FROM DIFFUSION PUMP OILS .2. DELTA-ETA ANALYSIS FOR DC-705
GOTO, K
ISHIKAWA, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (03) : 227 - &
[10] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES
PALMBERG, PW
RHODIN, TN
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &