EXAFS OF A THIN-FILM OF CU MEASURED BY TOTAL REFLECTION

被引：5

作者：

MARTENS, G

RABE, P

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 57卷 / 01期

关键词：

D O I：

10.1002/pssa.2210570160

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：K31 / K34

页数：4

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[6] MARTENS G, UNPUBLISHED
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