CHARACTERIZATION OF A NI/C MULTILAYER WITH FLUORESCENCE XAFS EXPERIMENTS AT FIXED STANDING-WAVE FIELD POSITIONS

被引：9

作者：

MEYER, DC ^{[1
]}

HOLZ, T ^{[1
]}

KRAWIETZ, R ^{[1
]}

RICHTER, K ^{[1
]}

WEHNER, B ^{[1
]}

PAUFLER, P ^{[1
]}

机构：

[1] FRAUNHOFER INST WERKSTOFFPHYS & SCHICHTTECHNOL DR,D-01069 DRESDEN,GERMANY

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1995年 / 150卷 / 02期

关键词：

D O I：

10.1002/pssa.2211500204

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A ninefold Ni/C multilayer is characterized by X-ray reflectometry and fluorescence XAFS (X-ray absorption fine structure) combined in one experiment. Synchrotron radiation and a standing wave field which occurs for reflection at the first Bragg reflection order of the multilayer are used. A defined shift of the standing wave field position leads to different weights of absorption and hence fluorescence contributions of the atoms within the layers. Thus it is possible to investigate the neighbourhood of the Ni atoms in dependence on their depth position within the Ni layer.

引用

页码：603 / 612

页数：10

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