HIGH-FIELD ELECTRON-TRANSPORT IN SILICON-ON-SAPPHIRE LAYERS

被引：8

作者：

COOK, RK ^{[1
]}

FREY, J ^{[1
]}

机构：

[1] CORNELL UNIV,NAT RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853

来源：

关键词：

D O I：

10.1063/1.327997

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2656 / 2658

页数：3

共 8 条

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[5]

NAG BR, 1972, THEORY ELECTRICAL TR, P115

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TOGEI, R .

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FREY, J .

[8] SERIES RESISTANCE EFFECTS IN SEMICONDUCTOR CV PROFILING [J].

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MILLER, GL .