MANIFESTATION OF ZERO-POINT QUANTUM FLUCTUATIONS IN ATOMIC FORCE MICROSCOPY

被引：50

作者：

HARTMANN, U

机构：

[1] Institute for Thin Film, Ion Technology Forschungszentrum J̈lich

来源：

PHYSICAL REVIEW B | 1990年 / 42卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.42.1541

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Based on rigorous quantum-field theory, long-range probe-sample dispersion forces in atomic force microscopy are analyzed. The interactions, being attractive or repulsive, can be divided into a purely geometrical part, depending on probe geometry and working distance, and a solely material-dependent part given in terms of the dielectric permittivities involved. The calculations are consistent with published experimental data and promise new analytical possibilities opened by dispersion microscopy.€ ™€ ™ © 1990 The American Physical Society.

引用

页码：1541 / 1546

页数：6

共 36 条

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