CURRENT APPLICATIONS OF ELECTRON-ENERGY LOSS SPECTROSCOPY

被引：18

作者：

STOBBS, WM

BOURDILLON, AJ

机构：

来源：

ULTRAMICROSCOPY | 1982年 / 9卷 / 03期

关键词：

D O I：

10.1016/0304-3991(82)90216-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：303 / 306

页数：4

共 18 条

[1] AN APPLICATION OF EELS IN THE EXAMINATION OF INCLUSIONS AND GRAIN-BOUNDARIES OF A SIC CERAMIC [J].

BOURDILLON, AJ ;

JEPPS, NW ;

STOBBS, WM ;

KRIVANEK, OL .

JOURNAL OF MICROSCOPY-OXFORD, 1981, 124 (OCT) :49-56

[2] CRYSTALLOGRAPHIC ORIENTATION EFFECTS IN ENERGY DISPERSIVE-X-RAY ANALYSIS [J].

BOURDILLON, AJ ;

SELF, PG ;

STOBBS, WM .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 44 (06) :1335-1350

[3]

BOURDILLON AJ, 1981, BOOK 277, P147

[4] STUDY OF SINGLE-ELECTRON EXCITATIONS BY ELECTRON-MICROSCOPY .1. IMAGE-CONTRAST FROM DELOCALIZED EXCITATIONS [J].

CRAVEN, AJ ;

GIBSON, JM ;

HOWIE, A ;

SPALDING, DR .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 38 (05) :519-527

[5]

DISKO MM, 1981, 39TH P EMSA C, P192

[6]

DORIGNAC D, 1980, UNPUB

[7] K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1979, 4 (02) :169-179

[8] VALUES OF K-SHELL PARTIAL CROSS-SECTION FOR ELECTRON ENERGY-LOSS SPECTROMETRY [J].

EGERTON, RF .

JOURNAL OF MICROSCOPY-OXFORD, 1981, 123 (SEP) :333-337

[9]

EGERTON RF, 1981, 39TH P ANN EMSA M AT, P198

[10] IMAGE-CONTRAST AND LOCALIZED SIGNAL SELECTION TECHNIQUES [J].

HOWIE, A .

JOURNAL OF MICROSCOPY-OXFORD, 1979, 117 (SEP) :11-23

← 1 2 →