MARKER MOTION DURING ELECTROMIGRATION IN THIN-FILMS

被引：6

作者：

OHRING, M

SUN, PH

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1972年 / 9卷 / 01期

关键词：

D O I：

10.1116/1.1316582

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：284 / &

共 15 条

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[2]

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[3]

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MEIERAN, ES .

[5]

DARKEN LS, 1948, T AIME, V174, P184

HOWARD, JK ;

ROSS, RF .

[7]

HUNTINGTON HB, 1969, T AIME, V245, P2571

[8] THEORY OF IMPURITY DIFFUSION IN METALS [J].

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[9]

LIDAIRD AB, 1960, PHIL MAG, V5, P1171

[10] CURRENT INDUCED MOTION OF LATTICE DEFECTS IN INDIUM METAL [J].

LODDING, A .