DIFFUSION LENGTH DETERMINATION IN P-N-JUNCTION DIODES AND SOLAR-CELLS

[1] Bell R. O., 1978, Thirteenth IEEE Photovoltaic Specialists Conference1978, P89

[2] MINORITY CARRIER LIFETIME IN P-N JUNCTION DEVICES [J]. JOURNAL OF APPLIED PHYSICS, 1957, 28 (08) : 878 - 881

[3] Hovel H.J., 1975, SEMICONDUCT SEMIMET, V11, P19

[4] MEASUREMENT OF MINORITY-CARRIER LIFETIME IN SOLAR-CELLS FROM PHOTOINDUCED OPEN-CIRCUIT VOLTAGE DECAY [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (05) : 733 - 739

[5] NEUGROSCHEL A, 1977, IEEE T ELECTRON DEV, V24, P662, DOI 10.1109/T-ED.1977.18800

[6] DIFFUSION LENGTH AND LIFETIME DETERMINATION IN P-N-JUNCTION SOLAR-CELLS AND DIODES BY FORWARD-BIASED CAPACITANCE MEASUREMENTS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (04) : 485 - 490

[7] OPTICAL CONSTANTS OF SILICON IN THE REGION 1 TO 10 EV [J]. PHYSICAL REVIEW, 1960, 120 (01): : 37 - 38

[8] INTERPRETATION OF STEADY-STATE SURFACE PHOTOVOLTAGE MEASUREMENTS IN EPITAXIAL SEMICONDUCTOR LAYERS [J]. SOLID-STATE ELECTRONICS, 1972, 15 (10) : 1097 - &

[9] A METHOD FOR MINIMIZING A SUM OF SQUARES OF NON-LINEAR FUNCTIONS WITHOUT CALCULATING DERIVATIVES [J]. COMPUTER JOURNAL, 1965, 7 (04) : 303 - 307

[10] DIFFUSION LENGTHS IN SOLAR-CELLS FROM SHORT-CIRCUIT CURRENT MEASUREMENTS [J]. APPLIED PHYSICS LETTERS, 1977, 30 (08) : 425 - 426

[1] Bell R. O., 1978, Thirteenth IEEE Photovoltaic Specialists Conference1978, P89

[2] MINORITY CARRIER LIFETIME IN P-N JUNCTION DEVICES [J]. JOURNAL OF APPLIED PHYSICS, 1957, 28 (08) : 878 - 881

[3] Hovel H.J., 1975, SEMICONDUCT SEMIMET, V11, P19

[4] MEASUREMENT OF MINORITY-CARRIER LIFETIME IN SOLAR-CELLS FROM PHOTOINDUCED OPEN-CIRCUIT VOLTAGE DECAY [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (05) : 733 - 739

[5] NEUGROSCHEL A, 1977, IEEE T ELECTRON DEV, V24, P662, DOI 10.1109/T-ED.1977.18800

[6] DIFFUSION LENGTH AND LIFETIME DETERMINATION IN P-N-JUNCTION SOLAR-CELLS AND DIODES BY FORWARD-BIASED CAPACITANCE MEASUREMENTS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (04) : 485 - 490

[7] OPTICAL CONSTANTS OF SILICON IN THE REGION 1 TO 10 EV [J]. PHYSICAL REVIEW, 1960, 120 (01): : 37 - 38

[8] INTERPRETATION OF STEADY-STATE SURFACE PHOTOVOLTAGE MEASUREMENTS IN EPITAXIAL SEMICONDUCTOR LAYERS [J]. SOLID-STATE ELECTRONICS, 1972, 15 (10) : 1097 - &

[9] A METHOD FOR MINIMIZING A SUM OF SQUARES OF NON-LINEAR FUNCTIONS WITHOUT CALCULATING DERIVATIVES [J]. COMPUTER JOURNAL, 1965, 7 (04) : 303 - 307

[10] DIFFUSION LENGTHS IN SOLAR-CELLS FROM SHORT-CIRCUIT CURRENT MEASUREMENTS [J]. APPLIED PHYSICS LETTERS, 1977, 30 (08) : 425 - 426