DIFFUSION LENGTH AND LIFETIME DETERMINATION IN P-N-JUNCTION SOLAR-CELLS AND DIODES BY FORWARD-BIASED CAPACITANCE MEASUREMENTS

被引：40

作者：

NEUGROSCHEL, A

CHEN, PJ

PAO, SC

LINDHOLM, FA

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1978年 / 25卷 / 04期

关键词：

D O I：

10.1109/T-ED.1978.19111

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：485 / 490

页数：6

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