INTERPRETATION OF STEADY-STATE SURFACE PHOTOVOLTAGE MEASUREMENTS IN EPITAXIAL SEMICONDUCTOR LAYERS

被引：55

作者：

PHILLIPS, WE

机构：

来源：

SOLID-STATE ELECTRONICS | 1972年 / 15卷 / 10期

关键词：

D O I：

10.1016/0038-1101(72)90168-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1097 / &

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