VOLTAGE DEPENDENCE OF PROXIMITY EFFECTS IN ELECTRON-BEAM LITHOGRAPHY

被引:32
作者
KYSER, DF
TING, CH
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1979年 / 16卷 / 06期
关键词
D O I
10.1116/1.570288
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:1759 / 1763
页数:5
相关论文
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