PHOTOELECTRON IMAGING OF FERMI SURFACES

被引：13

作者：

KURTZ, RL ^{[1
]}

ROBEY, SW ^{[1
]}

HUDSON, LT ^{[1
]}

SMILGYS, RV ^{[1
]}

STOCKBAUER, RL ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL,DIV SURFACE & MICROANAL SCI,GAITHERSBURG,MD 20899

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1992年 / 319卷 / 1-3期

关键词：

D O I：

10.1016/0168-9002(92)90563-J

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe the use of an ellipsoidal-mirror analyzer to obtain cross-sectional images of electrons photoemitted from a bulk Fermi surface. The region of the Brillouin zone that is sampled can be varied by adjusting the photon energy, allowing a complete mapping of the electron Fermi surface. This technique provides an immediate and direct visualization of the occupied electronic states and their relationship to bulk symmetries.

引用

页码：257 / 263

页数：7

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