ON THE STRUCTURE OF DANGLING BOND DEFECTS IN SILICON

被引:17
作者
STUTZMANN, M
机构
来源
ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE NEUE FOLGE | 1987年 / 151卷
关键词
D O I
10.1524/zpch.1987.151.Part_1_2.211
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
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页码:211 / 222
页数:12
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共 30 条
[1]   EFFECT OF MATRIX INTERACTIONS AND BUFFER GASES ON ATOMIC NITROGEN HYPERFINE SPLITTING [J].
ADRIAN, FJ .
PHYSICAL REVIEW, 1962, 127 (03) :837-&
[2]   ELECTRON SPIN RESONANCE IN DEFORMED SILICON [J].
Alexander, H. ;
Labusch, R. ;
Sander, W. .
SOLID STATE COMMUNICATIONS, 1965, 3 (11) :357-360
[3]   HYPERFINE STUDIES OF DANGLING BONDS IN AMORPHOUS-SILICON [J].
BIEGELSEN, DK ;
STUTZMANN, M .
PHYSICAL REVIEW B, 1986, 33 (05) :3006-3011
[4]  
BIEGELSEN DK, UNPUB
[5]   SI-29 HYPERFINE-STRUCTURE OF UNPAIRED SPINS AT THE SI/SIO2 INTERFACE [J].
BROWER, KL .
APPLIED PHYSICS LETTERS, 1983, 43 (12) :1111-1113
[6]   ESR CENTERS, INTERFACE STATES, AND OXIDE FIXED CHARGE IN THERMALLY OXIDIZED SILICON WAFERS [J].
CAPLAN, PJ ;
POINDEXTER, EH ;
DEAL, BE ;
RAZOUK, RR .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (09) :5847-5854
[7]   ELECTRON PARAMAGNETIC RESONANCE FROM CLEAN SINGLE-CRYSTAL CLEAVAGE SURFACES OF SILICON [J].
HANEMAN, D .
PHYSICAL REVIEW, 1968, 170 (03) :705-&
[8]   ELECTRON-SPIN-RESONANCE AND ELECTRICAL-PROPERTIES OF P-DOPED MICROCRYSTALLINE SI [J].
HASEGAWA, S ;
NARIKAWA, S ;
KURATA, Y .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1983, 48 (05) :431-447
[9]  
HASEGAWA S, 1982, J APPL PHYS, V53, P5022, DOI 10.1063/1.331378
[10]   ELECTRON SPIN RESONANCE OF FREE RADICALS FORMED FROM GROUP-4 AND GROUP-5 HYDRIDES IN INERT MATRICES AT LOW TEMPERATURE [J].
JACKEL, GS ;
GORDY, W .
PHYSICAL REVIEW, 1968, 176 (02) :443-&