BASIC ASPECTS OF ENERGY-LOSS SPECTROMETER SYSTEMS

[1] HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) : 411 - &

[2] CREWE AV, 1977, OPTIK, V47, P299

[3] WIEN FILTER FOR USE AS AN ENERGY ANALYZER WITH AN ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (05) : 630 - +

[4] SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE [J]. ULTRAMICROSCOPY, 1978, 3 (01) : 39 - 47

[5] EGERTON RF, 1976, DEV ELECTRON MICROSC, P35

[6] ENGE HA, 1967, FOCUSING CHARGED PAR, V2, pCH4

[7] FIELDS JR, 1977, ULTRAMICROSCOPY, V2, P311

[8] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52

[9] CHOICE OF OPERATING PARAMETERS FOR MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY [J]. ULTRAMICROSCOPY, 1978, 3 (01) : 69 - 74

[10] KOKUBO Y, 1976, J ELECTRON MICROSC, V25, P123

[1] HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) : 411 - &

[2] CREWE AV, 1977, OPTIK, V47, P299

[3] WIEN FILTER FOR USE AS AN ENERGY ANALYZER WITH AN ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (05) : 630 - +

[4] SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE [J]. ULTRAMICROSCOPY, 1978, 3 (01) : 39 - 47

[5] EGERTON RF, 1976, DEV ELECTRON MICROSC, P35

[6] ENGE HA, 1967, FOCUSING CHARGED PAR, V2, pCH4

[7] FIELDS JR, 1977, ULTRAMICROSCOPY, V2, P311

[8] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52

[9] CHOICE OF OPERATING PARAMETERS FOR MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY [J]. ULTRAMICROSCOPY, 1978, 3 (01) : 69 - 74

[10] KOKUBO Y, 1976, J ELECTRON MICROSC, V25, P123