学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
BASIC ASPECTS OF ENERGY-LOSS SPECTROMETER SYSTEMS
被引:5
作者
:
JOHNSON, DE
论文数:
0
引用数:
0
h-index:
0
JOHNSON, DE
机构
:
来源
:
ULTRAMICROSCOPY
|
1978年
/ 3卷
/ 04期
关键词
:
D O I
:
10.1016/S0304-3991(78)80054-0
中图分类号
:
TH742 [显微镜];
学科分类号
:
摘要
:
引用
收藏
页码:361 / 365
页数:5
相关论文
共 12 条
[1]
HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY
CREWE, AV
论文数:
0
引用数:
0
h-index:
0
CREWE, AV
ISAACSON, M
论文数:
0
引用数:
0
h-index:
0
ISAACSON, M
JOHNSON, D
论文数:
0
引用数:
0
h-index:
0
JOHNSON, D
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1971,
42
(04)
: 411
-
&
[2]
CREWE AV, 1977, OPTIK, V47, P299
[3]
WIEN FILTER FOR USE AS AN ENERGY ANALYZER WITH AN ELECTRON MICROSCOPE
CURTIS, GH
论文数:
0
引用数:
0
h-index:
0
CURTIS, GH
SILCOX, J
论文数:
0
引用数:
0
h-index:
0
SILCOX, J
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1971,
42
(05)
: 630
-
+
[4]
SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE
EGERTON, RF
论文数:
0
引用数:
0
h-index:
0
EGERTON, RF
[J].
ULTRAMICROSCOPY,
1978,
3
(01)
: 39
-
47
[5]
EGERTON RF, 1976, DEV ELECTRON MICROSC, P35
[6]
ENGE HA, 1967, FOCUSING CHARGED PAR, V2, pCH4
[7]
FIELDS JR, 1977, ULTRAMICROSCOPY, V2, P311
[8]
MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS
论文数:
引用数:
h-index:
机构:
ISAACSON, M
论文数:
引用数:
h-index:
机构:
JOHNSON, D
[J].
ULTRAMICROSCOPY,
1975,
1
(01)
: 33
-
52
[9]
CHOICE OF OPERATING PARAMETERS FOR MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY
JOY, DC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
JOY, DC
MAHER, DM
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
MAHER, DM
[J].
ULTRAMICROSCOPY,
1978,
3
(01)
: 69
-
74
[10]
KOKUBO Y, 1976, J ELECTRON MICROSC, V25, P123
←
1
2
→
共 12 条
[1]
HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY
CREWE, AV
论文数:
0
引用数:
0
h-index:
0
CREWE, AV
ISAACSON, M
论文数:
0
引用数:
0
h-index:
0
ISAACSON, M
JOHNSON, D
论文数:
0
引用数:
0
h-index:
0
JOHNSON, D
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1971,
42
(04)
: 411
-
&
[2]
CREWE AV, 1977, OPTIK, V47, P299
[3]
WIEN FILTER FOR USE AS AN ENERGY ANALYZER WITH AN ELECTRON MICROSCOPE
CURTIS, GH
论文数:
0
引用数:
0
h-index:
0
CURTIS, GH
SILCOX, J
论文数:
0
引用数:
0
h-index:
0
SILCOX, J
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1971,
42
(05)
: 630
-
+
[4]
SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE
EGERTON, RF
论文数:
0
引用数:
0
h-index:
0
EGERTON, RF
[J].
ULTRAMICROSCOPY,
1978,
3
(01)
: 39
-
47
[5]
EGERTON RF, 1976, DEV ELECTRON MICROSC, P35
[6]
ENGE HA, 1967, FOCUSING CHARGED PAR, V2, pCH4
[7]
FIELDS JR, 1977, ULTRAMICROSCOPY, V2, P311
[8]
MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS
论文数:
引用数:
h-index:
机构:
ISAACSON, M
论文数:
引用数:
h-index:
机构:
JOHNSON, D
[J].
ULTRAMICROSCOPY,
1975,
1
(01)
: 33
-
52
[9]
CHOICE OF OPERATING PARAMETERS FOR MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY
JOY, DC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
JOY, DC
MAHER, DM
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
MAHER, DM
[J].
ULTRAMICROSCOPY,
1978,
3
(01)
: 69
-
74
[10]
KOKUBO Y, 1976, J ELECTRON MICROSC, V25, P123
←
1
2
→