ELECTRONIC-STRUCTURE OF ALUMINUM NITRIDE - THEORY AND EXPERIMENT

被引:66
作者
LOUGHIN, S
FRENCH, RH
CHING, WY
XU, YN
SLACK, GA
机构
[1] UNIV MISSOURI,DEPT PHYS,KANSAS CITY,MO 64110
[2] GE CO,CORP RES & DEV,SCHENECTADY,NY 12301
关键词
D O I
10.1063/1.109764
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the results of a vacuum ultraviolet (VUV) study of single crystal and polycrystalline AlN over the range 4-40 eV and compare these with theoretical optical properties calculated from first principles using an orthogonalized linear combination of atomic orbitals in the local density approximation. The electronic structure of AlN has a two-dimensional (2D) character indicated by logarithmic divergences at 8.7 and 14 eV. These mark the centers of two sets of 2D critical points which are associated with N 2p --> Al 3s transitions and Al=N --> Al 3p transitions, respectively. A third feature is centered at 33 eV and associated with N 2s --> Al 3d transitions.
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页码:1182 / 1184
页数:3
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