A CONTINUOUS X-RAY STUDY OF THE INTERFACIAL REACTION IN AU-AL THIN-FILM COUPLES

被引:21
作者
VANDENBERG, JM
HAMM, RA
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 19卷 / 01期
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D O I
10.1116/1.571021
中图分类号
O59 [应用物理学];
学科分类号
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页码:84 / 88
页数:5
相关论文
共 11 条
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