KINETICS OF PHASE FORMATION IN AU-AL THIN-FILMS

[1] BOWER RW, 1973, APPL PHYS LETT, V23, P99, DOI 10.1063/1.1654823

[2] CAMPISANO SU, 1974, APPLICATIONS ION BEA, P159

[3] CHU WK, 1973, THIN SOLID FILMS, V13, P423

[4] FRANCOMBE MH, 1967, THIN SOLID FILMS, V1, P353

[5] HANSEN M, 1958, CONSTITUTION BINARY, P68

[6] SOME ASPECTS OF THE GROWTH OF DIFFUSION LAYERS IN BINARY SYSTEMS [J]. JOURNAL OF NUCLEAR MATERIALS, 1961, 3 (01) : 21 - 29

[7] KOLESNIK.DP, 1972, FIZ MET METALLOVED+, V34, P529

[8] EVALUATION OF GLANCING ANGLE X-RAY-DIFFRACTION AND MEV HE-4 BACKSCATTERING ANALYSES OF SILICIDE FORMATION [J]. THIN SOLID FILMS, 1974, 23 (02) : 205 - 213

[9] INTERMETALLIC FORMATION IN GOLD-ALUMINUM SYSTEMS [J]. SOLID-STATE ELECTRONICS, 1970, 13 (10) : 1391 - +

[10] PICRAUX ST, IN PRESS

[1] BOWER RW, 1973, APPL PHYS LETT, V23, P99, DOI 10.1063/1.1654823

[2] CAMPISANO SU, 1974, APPLICATIONS ION BEA, P159

[3] CHU WK, 1973, THIN SOLID FILMS, V13, P423

[4] FRANCOMBE MH, 1967, THIN SOLID FILMS, V1, P353

[5] HANSEN M, 1958, CONSTITUTION BINARY, P68

[6] SOME ASPECTS OF THE GROWTH OF DIFFUSION LAYERS IN BINARY SYSTEMS [J]. JOURNAL OF NUCLEAR MATERIALS, 1961, 3 (01) : 21 - 29

[7] KOLESNIK.DP, 1972, FIZ MET METALLOVED+, V34, P529

[8] EVALUATION OF GLANCING ANGLE X-RAY-DIFFRACTION AND MEV HE-4 BACKSCATTERING ANALYSES OF SILICIDE FORMATION [J]. THIN SOLID FILMS, 1974, 23 (02) : 205 - 213

[9] INTERMETALLIC FORMATION IN GOLD-ALUMINUM SYSTEMS [J]. SOLID-STATE ELECTRONICS, 1970, 13 (10) : 1391 - +

[10] PICRAUX ST, IN PRESS