Reinterpretation of the scanning tunneling microscopy images of Si(100)-(2 x 1) dimers

被引:61
作者
Hata, K
Yasuda, S
Shigekawa, H
机构
[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan
[2] Univ Tsukuba, CREST, Japan Sci & Technol Corp, Tsukuba, Ibaraki 3058573, Japan
关键词
D O I
10.1103/PhysRevB.60.8164
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We revisit and refine the interpretation of the scanning tunneling microscopy (STM) images of the Si(100) dimers, based on results from an extensive set of STM observations carried out at low temperature (80 K) and total-energy calculations of Si(100) surfaces. The interpretation addresses some unresolved questions and brings much experimental and theoretical research into unanimous agreement. We show that tunneling from surface resonances and bulk states seriously contributes to the STM images within usual tunneling conditions. In the empty state, tunneling from these states overwhelms tunneling from the localized pi* surface state, which STM is generally believed to observe.
引用
收藏
页码:8164 / 8170
页数:7
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