ELECTROLYTE ELECTROREFLECTANCE STUDY OF THE BAND OFFSET IN A GAAS GA0.69AL0.31AS SUPERLATTICE

被引：12

作者：

RACCAH, PM ^{[1
]}

GARLAND, JW ^{[1
]}

ZHANG, Z ^{[1
]}

CHAMBERS, FA ^{[1
]}

VEZZETTI, DJ ^{[1
]}

机构：

[1] AMOCO CORP,AMOCO RES CTR,NAPERVILLE,IL 60566

来源：

PHYSICAL REVIEW B | 1987年 / 36卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.36.4271

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4271 / 4278

页数：8

共 15 条

[1] [Anonymous], COMMUNICATION
[2] THIRD-DERIVATIVE MODULATION SPECTROSCOPY WITH LOW-FIELD ELECTROREFLECTANCE
ASPNES, DE
[J]. SURFACE SCIENCE, 1973, 37 (01) : 418 - 442
[3] VARIATIONAL CALCULATIONS ON A QUANTUM WELL IN AN ELECTRIC-FIELD
BASTARD, G
MENDEZ, EE
CHANG, LL
ESAKI, L
[J]. PHYSICAL REVIEW B, 1983, 28 (06): : 3241 - 3245
[4] ELECTROREFLECTANCE OF ION-IMPLANTED GAAS
BROWN, RL
SCHOONVELD, L
ABELS, LL
SUNDARAM, S
RACCAH, PM
[J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (04) : 2950 - 2957
[5] STAGGERED BAND ALIGNMENTS IN ALGAAS HETEROJUNCTIONS AND THE DETERMINATION OF VALENCE-BAND OFFSETS
DAWSON, P
WILSON, BA
TU, CW
MILLER, RC
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (08) : 541 - 543
[6] ELECTRONIC STATES AND THICKNESSES OF GAAS/GAALAS QUANTUM WELLS AS MEASURED BY ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY
ERMAN, M
THEETEN, JB
FRIJLINK, P
GAILLARD, S
HIA, FJ
ALIBERT, C
[J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (11) : 3241 - 3249
[7] ERMAN M, 1985, I PHYS C SER, V79
[8] GARLAND J, UNPUB
[9] GARLAND JW, 1986, SPIE P, V659, P32
[10] ELECTROREFLECTANCE SPECTROSCOPY FROM QUANTUM-WELL STRUCTURES IN AN ELECTRIC-FIELD
KLIPSTEIN, PC
TAPSTER, PR
APSLEY, N
ANDERSON, DA
SKOLNICK, MS
KERR, TM
WOODBRIDGE, K
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (06): : 857 - 871