ELECTRONIC STATES AND THICKNESSES OF GAAS/GAALAS QUANTUM WELLS AS MEASURED BY ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY

被引:59
作者
ERMAN, M [1 ]
THEETEN, JB [1 ]
FRIJLINK, P [1 ]
GAILLARD, S [1 ]
HIA, FJ [1 ]
ALIBERT, C [1 ]
机构
[1] UNIV SCI & TECH LANGUEDOC EM,F-34060 MONTPELLIER,FRANCE
关键词
D O I
10.1063/1.333843
中图分类号
O59 [应用物理学];
学科分类号
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页码:3241 / 3249
页数:9
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