CONTROL OF ELECTRIC FIELD AT SURFACE OF P-N JUNCTIONS

被引:116
作者
DAVIES, RL
GENTRY, FE
机构
关键词
D O I
10.1109/T-ED.1964.15335
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:313 / +
页数:1
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共 27 条
[1]  
ANDERSON RL, 1961, AN SOC ESP FIS QUIM, V57A, P3
[2]  
ARMSTRONG HL, 1956, IRE T, VED3, P86
[3]   UNIFORM SILICON P-N JUNCTIONS .1. BROAD AREA BREAKDOWN [J].
BATDORF, RL ;
CHYNOWETH, AG ;
DACEY, GC ;
FOY, PW .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (07) :1153-1160
[4]  
CLARK OM, 1960, J ELECTROCHEM SOC, V107, pC269
[5]   PHYSICAL THEORY OF SEMICONDUCTOR SURFACES [J].
GARRETT, CGB ;
BRATTAIN, WH .
PHYSICAL REVIEW, 1955, 99 (02) :376-387
[6]   SOME EXPERIMENTS ON, AND A THEORY OF, SURFACE BREAKDOWN [J].
GARRETT, CGB ;
BRATTAIN, WH .
JOURNAL OF APPLIED PHYSICS, 1956, 27 (03) :299-306
[7]   AVALANCHE EFFECTS IN SILICON P-N JUNCTIONS .2. STRUCTURALLY PERFECT JUNCTIONS [J].
GOETZBERGER, A ;
SCARLETT, RM ;
HAITZ, RH ;
MCDONALD, B .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (06) :1591-+
[8]   UNIFORM AVALANCHE EFFECT IN SILICON 3-LAYER DIODES [J].
GOETZBERGER, A .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (12) :2260-2261
[9]   AVALANCHE EFFECTS IN SILICON P-N JUNCTIONS .1. LOCALIZED PHOTOMULTIPLICATION STUDIES ON MICROPLASMAS [J].
HAITZ, RH ;
GOETZBERGER, A ;
SCARLETT, RM ;
SHOCKLEY, W .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (06) :1581-&
[10]  
Holmes P. J., 1962, ELECTROCHEMISTRY SEM