MICROBEAM ANALYSIS OF DEUTERIUM IN CARBON PROBES EXPOSED TO PLASMA IN THE DITE TOKAMAK

被引:10
作者
SOFIELD, CJ
MCCRACKEN, GM
BRIDWELL, LB
SHEA, J
HOTSTON, ES
ERENTS, SK
机构
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 191卷 / 1-3期
关键词
D O I
10.1016/0029-554X(81)91033-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:383 / 390
页数:8
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