LONG-TERM CHANGES IN SURFACE CONDITIONS OF PLT

[1] ALTSTETTER CJ, J VAC SCI TECHNOL

[2] BEHRISCH R, 1976, ERICE SUMMER SCH TOK

[3] BOL K, 1978, B AM PHYS SOC, V23, P187

[4] BOL K, COMMUNICATION

[5] BOTTIGER J, 1976, ION BEAM SURFACE LAY, V2, P811

[6] REACTION OF TUNGSTEN WITH CO2 AND D2O AT HIGH-TEMPERATURES AND LOW-PRESSURES [J]. SURFACE SCIENCE, 1977, 66 (01) : 272 - 298

[7] CECCHI JL, 1977, PPPL1256 PRINC PLASM

[8] CECCHI JL, 1978, PPPL1422 PRINC PLASM

[9] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41

[10] USE OF NUCLEAR-REACTIONS AND SIMS FOR QUANTITATIVE DEPTH PROFILING OF HYDROGEN IN AMORPHOUS SILICON [J]. APPLIED PHYSICS LETTERS, 1977, 31 (09) : 582 - 585

[1] ALTSTETTER CJ, J VAC SCI TECHNOL

[2] BEHRISCH R, 1976, ERICE SUMMER SCH TOK

[3] BOL K, 1978, B AM PHYS SOC, V23, P187

[4] BOL K, COMMUNICATION

[5] BOTTIGER J, 1976, ION BEAM SURFACE LAY, V2, P811

[6] REACTION OF TUNGSTEN WITH CO2 AND D2O AT HIGH-TEMPERATURES AND LOW-PRESSURES [J]. SURFACE SCIENCE, 1977, 66 (01) : 272 - 298

[7] CECCHI JL, 1977, PPPL1256 PRINC PLASM

[8] CECCHI JL, 1978, PPPL1422 PRINC PLASM

[9] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41

[10] USE OF NUCLEAR-REACTIONS AND SIMS FOR QUANTITATIVE DEPTH PROFILING OF HYDROGEN IN AMORPHOUS SILICON [J]. APPLIED PHYSICS LETTERS, 1977, 31 (09) : 582 - 585