共 16 条
[1]
CHARACTERIZATION OF INN, IN2O3, AND IN OXY-NITRIDE SEMICONDUCTING THIN-FILMS USING XPS ELECTRON-ENERGY LOSS SPECTRA
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1979, 16 (02)
:517-517
[3]
APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1974, 11 (01)
:212-224
[5]
MORPHOLOGY AND STRUCTURE OF INDIUM NITRIDE FILMS
[J].
APPLICATIONS OF SURFACE SCIENCE,
1985, 22-3 (MAY)
:663-669
[7]
KOYAMA R, COMMUNICATION
[10]
MCCUNE RC, 1981, J VAC SCI TECHNOL, V18, P700, DOI 10.1116/1.570930