TRANSMISSION ELECTRON-MICROSCOPE OBSERVATIONS OF DAMAGE IN INP INDUCED DURING HANDLING

被引:5
作者
COMER, JJ
机构
[1] Solid State Sciences Division, RADC, Hanscom Air Force Base
关键词
D O I
10.1063/1.326706
中图分类号
O59 [应用物理学];
学科分类号
摘要
Damage observed in InP specimens following thinning and mounting in a specimen holder for transmission electron microscopy consisted of two kinds. In one case microcracks were observed in {110} cleavage planes. These contained edge dislocations with Burgers vectors of the type b= (a/2) 〈110〉. A second kind consisted of dislocation clusters which gave rise to slip and stacking-fault formation during examination in the microscope. The results suggest that extreme care is essential in handling this material during device processing.
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页码:6003 / 6005
页数:3
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