DETERMINATION OF THE COMPLEX REFRACTIVE-INDEX OF INDIVIDUAL QUANTUM-WELLS FROM DISTRIBUTED REFLECTANCE

被引:5
作者
HICKERNELL, RK
CHRISTENSEN, DH
PELLEGRINO, JG
WANG, J
LEBURTON, JP
机构
[1] NATL INST STAND & TECHNOL,DIV SEMICOND ELECTR,GAITHERSBURG,MD 20899
[2] UNIV ILLINOIS,ENGN RES CTR COMPOUND SEMICOND MICROELECTR,DEPT ELECT & COMP ENGN,URBANA,IL 61801
关键词
D O I
10.1063/1.356153
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigate the measurement of the complex refractive index of individual quantum wells by reflectance spectroscopy. Placing the wells at half-wavelength spacing to cause resonant feedback produces an order-of-magnitude increase in measurement sensitivity over that of nonresonant structures. Quantum well dispersive and absorptive effects on reflectance can be differentiated in certain spectral regions. Experimental data confirm a theoretical model of refractive index and absorption for quantum wells of GaAs in Al0.2Ga0.8As in the region of the well band gap.
引用
收藏
页码:3056 / 3059
页数:4
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