X-RAY DEPTH PROFILING OF IRON-OXIDE THIN-FILMS

被引：75

作者：

TONEY, MF

HUANG, TC

BRENNAN, S

REK, Z

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

[2] STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305

来源：

JOURNAL OF MATERIALS RESEARCH | 1988年 / 3卷 / 02期

关键词：

D O I：

10.1557/JMR.1988.0351

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：351 / 356

页数：6

共 19 条

[1]

BARD Y, 1974, NONLINEAR PARAMETER

[2] MODEL-INDEPENDENT STRUCTURE DETERMINATION OF THE INSB(111)2X2 SURFACE WITH USE OF SYNCHROTRON X-RAY-DIFFRACTION [J].

BOHR, J ;

FEIDENHANSL, R ;

NIELSEN, M ;

TONEY, M ;

JOHNSON, RL ;

ROBINSON, IK .

PHYSICAL REVIEW LETTERS, 1985, 54 (12) :1275-1278

[3]

Born M, 1980, PRINCIPLES OPTICS

[4] TWO-DIMENSIONAL X-RAY-SCATTERING [J].

BRENNAN, S .

SURFACE SCIENCE, 1985, 152 (APR) :1-9

[5]

Brundle C.R., COMMUNICATION

[6] EFFECTS OF DEPOSITION AND OXIDATION PROCESSES ON MAGNETIC AND STRUCTURAL-PROPERTIES OF IRON-OXIDE FILMS [J].

CHEN, MM ;

ORTIZ, C ;

LIM, G ;

SIGSBEE, R ;

CASTILLO, G .

IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (05) :3423-3425

[7] STRAIN DISTRIBUTION IN THIN ALUMINUM FILMS USING X-RAY DEPTH PROFILING [J].

DOERNER, MF ;

BRENNAN, S .

JOURNAL OF APPLIED PHYSICS, 1988, 63 (01) :126-131

[8]

HANSEN M, 1958, CONSTITUTION BINARY, P687

[9] COMPOSITIONAL VARIATIONS IN DOPED IRON-OXIDE MAGNETIC THIN-FILMS [J].

HERMSMEIER, B ;

BRUNDLE, CR ;

BAGLIN, JEE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (05) :2864-2868

[10] ANALYSIS OF COBALT-DOPED IRON-OXIDE THIN-FILMS BY SYNCHROTRON RADIATION [J].

HUANG, TC ;

TONEY, MF ;

BRENNAN, S ;

REK, Z .

THIN SOLID FILMS, 1987, 154 (1-2) :439-445

← 1 2 →