X-RAY DEPTH PROFILING OF IRON-OXIDE THIN-FILMS

被引：75

作者：

TONEY, MF

HUANG, TC

BRENNAN, S

REK, Z

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

[2] STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305

来源：

JOURNAL OF MATERIALS RESEARCH | 1988年 / 3卷 / 02期

关键词：

D O I：

10.1557/JMR.1988.0351

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：351 / 356

页数：6

共 19 条

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[16] OBSERVATION OF MAGNETIC DEAD LAYERS AT THE SURFACE OF IRON-OXIDE FILMS [J].

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[17]

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[18] GRAZING-INCIDENCE DIFFRACTION AND THE DISTORTED-WAVE APPROXIMATION FOR THE STUDY OF SURFACES [J].

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[19] HIGH-DENSITY RECORDING CHARACTERISTICS OF SPUTTERED GAMMA-FE2O3 THIN-FILM DISKS [J].

YOSHII, S ;

ISHII, O ;

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ISHIDA, G .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :2556-2560

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