THE MAGNETORESISTIVITY, STRUCTURE, AND MAGNETIC-ANISOTROPY OF RF SPUTTERED AND E-BEAM EVAPORATED NIFE FILMS

被引：10

作者：

CHI, GC

MOGAB, CJ

BURTHERUS, AD

LEHNER, AG

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 03期

关键词：

D O I：

10.1063/1.328960

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2439 / 2441

页数：3

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[9] A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER [J].

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