ELECTRON-DENSITY DISTRIBUTION IN GERMANIUM FROM X-RAY-POWDER DATA BY THE MAXIMUM-ENTROPY METHOD

被引:7
作者
NAKAHIGASHI, K
HIGASHIMINE, K
ISHIBASHI, H
MINAMIGAWA, S
机构
[1] College of Integrated Arts and Sciences, University of Osaka Prefecture, Sakai, Osaka, 593, Gakuen-Cho
关键词
GERMANIUM; ELECTRON DENSITY MAP; POWDER X-RAY DIFFRACTION; MAXIMUM-ENTROPY METHOD; FORBIDDEN REFLECTION;
D O I
10.1016/0022-3697(93)90348-U
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The electron density distribution map of germanium has been drawn using the maximum-entropy method (MEM) with 11 independent structure factors and one combined structure factor, which were determined by the powder pattern decomposition from X-ray data. The R factor was 0.5% for the final MEM density map, though we used the powder data. The result indicates that the bonding electron with a level of 0.3 e angstrom-3 is clearly visible in the map even though no forbidden reflection is included in the analysis. This is the first observation of the bonding electron from powder X-ray diffraction data. Both the observed and calculated structure factors agreed well with previous measurements, where available. The structure factor F(222)e(-M) for the 222 forbidden reflection at room temperature calculated from the maximum-entropy map is - 1.056 and it shows good agreement with those measured by the integrated intensity using a nearly perfect single crystal.
引用
收藏
页码:1543 / 1548
页数:6
相关论文
共 21 条
[1]   VIBRATIONAL AMPLITUDES IN GERMANIUM AND SILICON [J].
BATTERMAN, BW ;
CHIPMAN, DR .
PHYSICAL REVIEW, 1962, 127 (03) :690-&
[2]   A STUDY OF (222) FORBIDDEN REFLECTION IN GERMANIUM AND SILICON [J].
COLELLA, R ;
MERLINI, A .
PHYSICA STATUS SOLIDI, 1966, 18 (01) :157-&
[4]   RELATIVISTIC CALCULATION OF ANOMALOUS SCATTERING FACTORS FOR X-RAYS [J].
CROMER, DT ;
LIBERMAN, D .
JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) :1891-&
[5]   REDETERMINATION OF ABSOLUTE STRUCTURE FACTORS FOR SILICON AT ROOM AND LIQUID-NITROGEN TEMPERATURES [J].
CUMMINGS, S ;
HART, M .
AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (03) :423-431
[6]   HIGH-ACCURACY STRUCTURE-FACTOR MEASUREMENTS IN GERMANIUM [J].
DEUTSCH, M ;
HART, M ;
CUMMINGS, S .
PHYSICAL REVIEW B, 1990, 42 (02) :1248-1253
[7]   X-RAY STRUCTURE FACTORS OF GERMANIUM DETERMINED FROM HALF-WIDTHS OF BRAGG-CASE DIFFRACTION CURVES [J].
MATSUSHITA, T ;
KOHRA, K .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 24 (02) :531-541
[8]   ELECTRON-DENSITY DISTRIBUTION IN ALN FROM POWDER X-RAY-DIFFRACTION DATA BY THE MAXIMUM-ENTROPY METHOD [J].
NAKAHIGASHI, K ;
ISHIBASHI, H ;
MINAMIGAWA, S .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1993, 54 (04) :445-452
[9]   X-RAY-DIFFRACTION STUDY ON ULTRAFINE PARTICLES OF AG-CU ALLOYS PREPARED BY HYDROGEN PLASMA-METAL REACTION METHOD [J].
NAKAHIGASHI, K ;
ISHIBASHI, H ;
MINAMIGAWA, S ;
KOGACHI, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (07) :2293-2298
[10]  
Renninger M., 1960, Z KRISTALLOGR, V113, P99