IR ELLIPSOMETRY STUDY OF ORIENTED MOLECULAR MONOLAYERS

被引：29

作者：

BENFERHAT, R ^{[1
]}

DREVILLON, B ^{[1
]}

ROBIN, P ^{[1
]}

机构：

[1] THOMSON CSF,CENT RECH LAB,F-91405 ORSAY,FRANCE

来源：

THIN SOLID FILMS | 1988年 / 156卷 / 02期

关键词：

D O I：

10.1016/0040-6090(88)90324-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：295 / 305

页数：11

共 15 条

[1] SURFACE STUDY OF LANGMUIR-BLODGETT-FILMS BY ELECTRON-MICROSCOPY AND X-RAY REFLECTIVITY [J].

ALLAIN, M ;

BENATTAR, JJ ;

RIEUTORD, F ;

ROBIN, P .

EUROPHYSICS LETTERS, 1987, 3 (03) :309-314

[2] AN INFRARED REFLECTION SPECTROSCOPY STUDY OF ORIENTED CADMIUM ARACHIDATE MONOLAYER FILMS ON EVAPORATED SILVER [J].

ALLARA, DL ;

SWALEN, JD .

JOURNAL OF PHYSICAL CHEMISTRY, 1982, 86 (14) :2700-2704

[3]

BENFERHAT R, 1987, THESIS PARIS

[4]

BENFERHAT R, 1987, P MAT RES SOC S, V77, P721

[5]

BENFERHAT R, IN PRESS J NONCRYST

[6] INFRARED AND ELECTRON-DIFFRACTION STUDIES OF TRANSIENT STAGES IN VERY THIN LANGMUIR-BLODGETT FILMS [J].

BONNEROT, A ;

CHOLLET, PA ;

FRISBY, H ;

HOCLET, M .

CHEMICAL PHYSICS, 1985, 97 (2-3) :365-377

[7] STUDIES OF ORIENTED LANGMUIR BLODGETT MULTILAYERS BY INFRARED LINEAR DICHROISM [J].

CHOLLET, PA ;

MESSIER, J .

CHEMICAL PHYSICS, 1982, 73 (1-2) :235-242

[8] IR ELLIPSOMETRIC SPECTROSCOPY - ITS APPLICATION TO BUTANOL ADSORBED ON SILVER [J].

DIGNAM, MJ ;

RAO, B ;

STOBIE, RW .

SURFACE SCIENCE, 1974, 46 (01) :308-310

[9] A SPECTROSCOPIC ELLIPSOMETRY STUDY OF THE NUCLEATION AND GROWTH OF PLASMA-DEPOSITED AMORPHOUS-SILICON [J].

DREVILLON, B .

THIN SOLID FILMS, 1985, 130 (1-2) :165-170

[10] FAST POLARIZATION MODULATED ELLIPSOMETER USING A MICROPROCESSOR SYSTEM FOR DIGITAL FOURIER-ANALYSIS [J].

DREVILLON, B ;

PERRIN, J ;

MARBOT, R ;

VIOLET, A ;

DALBY, JL .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (07) :969-977

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