A BUILT-IN SELF-TEST ALGORITHM FOR ROW COLUMN PATTERN SENSITIVE FAULTS IN RAMS

被引：9

作者：

FRANKLIN, M

SALUJA, KK

KINOSHITA, K

机构：

[1] UNIV WISCONSIN,DEPT ELECT & COMP ENGN,MADISON,WI 53706

[2] HIROSHIMA UNIV,DEPT INFORMAT & BEHAV SCI,HIROSHIMA 730,JAPAN

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1990年 / 25卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/4.52179

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Row and column sensitive faults in RAM's are a class of faults in which the contents of a cell become sensitive to the contents of the row and column containing the cell in presence of a fault. In this paper we formally define a fault model to include such faults and present an algorithm to detect faults from this fault model. We then describe two different implementations of the algorithm for a VLSI built-in-self-test (BIST) environment. They are: 1) a random-logic-based design, and 2) a microcode-based design. Finally we identify and list additional properties of the algorithm, such as its capability to detect stuck-at faults, coupling faults, and conventional pattern sensitive faults. 0018-9200/90/0400-0514$01.00 © 1990 IEEE

引用

页码：514 / 524

页数：11

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