VANDERWAALS EPITAXY OF THICK SB, GE, AND GE/SB FILMS ON MICA

被引:10
作者
OSTEN, HJ
KLATT, J
LIPPERT, G
机构
[1] MBE Laboratory, Institute of Semiconductor Physics, 0-1200 Frankfurt (Oder)
关键词
D O I
10.1063/1.107367
中图分类号
O59 [应用物理学];
学科分类号
摘要
We attempt to grow 20-nm-thick layers of Sb and Ge as well as periods of (20 nm Sb/20 nm Ge) layers on muscovite (a special form of mica) by van der Waals epitaxy under different growth conditions. The growth process was in situ investigated by reflection high-energy electron diffraction and Auger electron spectroscopy. Epitaxial Sb layers could be obtained even at cold substrates (mica or polycrystalline Ge layers). It was not possible to grow monocrystalline Ge layers by van der Waals epitaxy. Only a formation of oriented Ge grains could be observed at higher temperatures.
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页码:44 / 46
页数:3
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