The blunt tip geometry of the so-called nanoindenter is modeled by a spherical cap of various radii. The relation between area and penetration depth of the indenter is comparable with experimental results if the radius of the tip is about 1.0-mu-m. Simulation of indentation tests was carried out using the finite element method by incremental loading and unloading based on a continuum model. Good agreement with the experimental results for nickel is obtained also for a tip radius of 1.0-mu-m.
机构:
IBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Doerner, M. F.
;
Nix, W. D.
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机构:
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
机构:
IBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Doerner, M. F.
;
Nix, W. D.
论文数: 0引用数: 0
h-index: 0
机构:
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA