SUPERCONDUCTIVITY AND MICROSTRUCTURE OF EPITAXIAL (TL,BI) SR1.6BA0.4CA2CU3O9-DELTA THIN-FILMS

被引：11

作者：

WANG, CA ^{[1
]}

REN, ZF ^{[1
]}

WANG, JH ^{[1
]}

MILLER, DJ ^{[1
]}

机构：

[1] ARGONNE NATL LAB, DIV MAT SCI, ARGONNE, IL 60439 USA

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1995年 / 245卷 / 1-2期

关键词：

D O I：

10.1016/0921-4534(95)00083-6

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Epitaxial (Tl,Bi)Sr1.6Ba0.4Ca2Cu3O9-delta ((Tl,Bi)-1223) thin films on (100) single crystal LaAlO3 substrates were successfully synthesized by a two-step procedure. The (Tl,Bi)-1223 phase development in both air and argon was systematically investigated by X-ray diffraction. The microstructure and epitaxial relationship between films and substrates were measured by X-ray phi scan, transmission electron microscopy (TEM), and scanning electron microscopy (SEM). The DC resistance versus temperature transition, zero-field-cooled (ZFC) and field-cooled (FC) magnetization transition, hysteresis curve, and transport critical current density were measured. The zero-resistance transition temperature was 107 K, and the critical current density at 77 K and zero field was higher than 2 X 10(6) A/cm(2). (Tl,Bi)-1223 films have good flux-pinning properties as shown by the slow decrease of the critical current density in an external magnetic field.

引用

页码：171 / 180

页数：10

共 35 条

[1] TRANSPORT CHARACTERISTICS OF TL2BA2CACU2O8 BICRYSTAL GRAIN-BOUNDARY JUNCTIONS AT 77-K [J].