RECENT ADVANCES IN SCANNING TUNNELING MICROSCOPY INVOLVING MAGNETIC PROBES AND SAMPLES

被引：21

作者：

WIESENDANGER, R ^{[1
]}

BURGLER, D ^{[1
]}

TARRACH, G ^{[1
]}

SCHAUB, T ^{[1
]}

HARTMANN, U ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

SHVETS, IV ^{[1
]}

COEY, JMD ^{[1
]}

机构：

[1] UNIV DUBLIN TRINITY COLL,DEPT PHYS,DUBLIN 2,IRELAND

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1991年 / 53卷 / 05期

关键词：

D O I：

10.1007/BF00348147

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report on recent developments in the field of STM performed with magnetic probes and samples. The choice of appropriate magnetic sensors and their in situ preparation will be described. We further focus on the information obtained in spin-polarized scanning tunneling microscopy (SPSTM) as well as on possible modes of operation for simultaneous acquisition of topographic and magnetic data. The prospects for SPSTM and related magnetic sensitive SXM techniques will be discussed.

引用

页码：349 / 355

页数：7

共 34 条

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