DIRECT OBSERVATION OF THE PRECESSION OF INDIVIDUAL PARAMAGNETIC SPINS ON OXIDIZED SILICON SURFACES

被引：199

作者：

MANASSEN, Y

HAMERS, RJ

DEMUTH, JE

CASTELLANO, AJ

机构：

来源：

PHYSICAL REVIEW LETTERS | 1989年 / 62卷 / 21期

关键词：

D O I：

10.1103/PhysRevLett.62.2531

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：2531 / 2534

页数：4

相关论文

共 16 条

[1] Abragam A., 1970, ELECT PARAMAGNETIC R
[2] S-D EXCHANGE MODEL OF ZERO-BIAS TUNNELING ANOMALIES
APPELBAUM, J
[J]. PHYSICAL REVIEW LETTERS, 1966, 17 (02) : 91 - +
[3] TUNNEL ELECTRON-PARAMAGNETIC-RES SPECTROSCOPY
BELYANIN, AL
KESSEL, AR
ZHIKHAREV, VA
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1982, 15 (29): : 6021 - 6029
[4] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
[5] ELECTRON-SPIN-RESONANCE STUDIES OF O-2(-) ADSORBED ON SILICA-GEL - PHOTOFORMATION AND ROTATIONAL-DYNAMICS
HOWE, RF
TIMMER, WC
[J]. JOURNAL OF CHEMICAL PHYSICS, 1986, 85 (10) : 6129 - 6135
[6] CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY
KOCH, RH
HAMERS, RJ
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 333 - 339
[7] MEZEI R, 1971, PHYS REV B, V3, P167
[8] MOTCHENBACHER CD, 1973, LOW NOISE ELECTRONIC
[9] STUDY OF SILICON-SILICON DIOXIDE STRUCTURE BY ELECTRON SPIN RESONANCE .1.
NISHI, Y
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (01) : 52 - +
[10] PAKE GE, 1973, PHYSICAL PRINCIPLES