HIGH-RESOLUTION SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR USE IN CHEMISTRY

被引：14

作者：

KLOPPEL, KD

VONBUNAU, G

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1981年 / 39卷 / 01期

关键词：

D O I：

10.1016/0020-7381(81)80123-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：85 / 93

页数：9

共 10 条

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[7]

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