HYDRODYNAMIC EQUATIONS FOR SEMICONDUCTORS WITH NONPARABOLIC BAND-STRUCTURE

被引:99
作者
THOMA, R
EMUNDS, A
MEINERZHAGEN, B
PEIFER, HJ
ENGL, WL
机构
[1] Institut für Theoretische Elektrotechnik. University of Aachen
关键词
D O I
10.1109/16.81625
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A system of generalized hydrodynamic equations is derived from Boltzmann's transport equation for semiconductors without the assumption of a parabolic band structure. After some simplifications these equations can be arranged in such a way that their structure is similar to that of the well-known conventional ones. For this purpose the quantity carrier temperature is redefined and five relaxation times have to be introduced instead of the two having been in use so far, in order to take nonparabolicity into account. For all quantities of interest results from Monte Carlo simulation are presented for silicon with impurity concentration up to 10(18) cm-3 and electric field up to 200 kV/cm. They show, that two of the five relaxation times are not distinguishable, hence for silicon at room temperature the number of relaxation times can be reduced to four. Considerable deviations from results derived under the assumption of a parabolic band structure demonstrate the necessity of this generalized hydrodynamic model. Finally, the new hydrodynamic model is applied to a n-channel LDD MOSFET with 0.5-mu-m channel length. The results agree well with the respective Monte Carlo device simulation.
引用
收藏
页码:1343 / 1353
页数:11
相关论文
共 32 条
[1]   HOT-ELECTRON FLOW IN AN INHOMOGENEOUS FIELD [J].
ARTAKI, M .
APPLIED PHYSICS LETTERS, 1988, 52 (02) :141-143
[2]   COLLISION INTEGRALS FOR DISPLACED MAXWELLIAN DISTRIBUTIONS [J].
BLOTEKJA.K ;
LUNDE, EB .
PHYSICA STATUS SOLIDI, 1969, 35 (02) :581-+
[3]  
BROOKS H, 1951, PHYS REV, V83, P879
[4]   DIFFUSION-COEFFICIENT OF ELECTRONS IN SILICON [J].
BRUNETTI, R ;
JACOBONI, C ;
NAVA, F ;
REGGIANI, L ;
BOSMAN, G ;
ZIJLSTRA, RJJ .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) :6713-6722
[5]   HIGH-FIELD DIFFUSION OF ELECTRONS IN SILICON [J].
CANALI, C ;
JACOBONI, C ;
OTTAVIANI, G ;
ALBERIGIQUARANTA, A .
APPLIED PHYSICS LETTERS, 1975, 27 (05) :278-280
[6]   ALCOHOL-CONSUMPTION AND BLOOD-PRESSURE - SURVEY OF THE RELATIONSHIP AT A HEALTH-SCREENING CLINIC [J].
COOKE, KM ;
FROST, GW ;
THORNELL, IR ;
STOKES, GS .
MEDICAL JOURNAL OF AUSTRALIA, 1982, 1 (02) :65-69
[7]   DEVICE MODELING [J].
ENGL, WL ;
DIRKS, HK ;
MEINERZHAGEN, B .
PROCEEDINGS OF THE IEEE, 1983, 71 (01) :10-33
[8]  
ENGL WL, 1989, 1989 VLSI PROC DEV M
[9]   DIFFUSION AND THE POWER SPECTRAL DENSITY AND CORRELATION-FUNCTION OF VELOCITY FLUCTUATION FOR ELECTRONS IN SI AND GAAS BY MONTE-CARLO METHODS [J].
FAUQUEMBERGUE, R ;
ZIMMERMANN, J ;
KASZYNSKI, A ;
CONSTANT, E ;
MICROONDES, G .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) :1065-1071
[10]   MONTE-CARLO DETERMINATION OF ELECTRON TRANSPORT PROPERTIES IN GALLIUM ARSENIDE [J].
FAWCETT, W ;
BOARDMAN, AD ;
SWAIN, S .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1970, 31 (09) :1963-&