SCANNING TUNNELING MICROSCOPY STUDIES OF STRUCTURAL DISORDER AND STEPS ON SI SURFACES

被引：346

作者：

SWARTZENTRUBER, BS

MO, YW

WEBB, MB

LAGALLY, MG

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 04期

关键词：

D O I：

10.1116/1.576167

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：2901 / 2905

页数：5

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