ROUGHNESS EXPONENTS - A PARADOX RESOLVED

被引：99

作者：

KRIM, J ^{[1
]}

INDEKEU, JO ^{[1
]}

机构：

[1] NORTHEASTERN UNIV,DEPT PHYS,BOSTON,MA 02115

来源：

PHYSICAL REVIEW E | 1993年 / 48卷 / 02期

关键词：

D O I：

10.1103/PhysRevE.48.1576

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The spatial scaling behavior of a self-affine surface is parametrized with what is commonly referred to as a ''roughness'' exponent. The paradox of whether large or small values of this exponent correspond to ''rougher'' surfaces is resolved here.

引用

页码：1576 / 1578

页数：3

共 11 条

[1] X-RAY REFLECTIVITY AND ADSORPTION-ISOTHERM STUDY OF FRACTAL SCALING IN VAPOR-DEPOSITED FILMS [J].

CHIARELLO, R ;

PANELLA, V ;

KRIM, J ;

THOMPSON, C .

PHYSICAL REVIEW LETTERS, 1991, 67 (24) :3408-3411

[2] SUBMICRON-SCALE SURFACE ROUGHENING INDUCED BY ION-BOMBARDMENT [J].

EKLUND, EA ;

BRUINSMA, R ;

RUDNICK, J ;

WILLIAMS, RS .

PHYSICAL REVIEW LETTERS, 1991, 67 (13) :1759-1762

[3] DYNAMIC SCALING OF THE INTERFACE IN 2-PHASE VISCOUS FLOWS IN POROUS-MEDIA [J].

HORVATH, VK ;

FAMILY, F ;

VICSEK, T .

JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1991, 24 (01) :L25-L29

[4] MOLECULAR-BEAM EPITAXIAL-GROWTH AND SURFACE-DIFFUSION [J].

KESSLER, DA ;

LEVINE, H ;

SANDER, LM .

PHYSICAL REVIEW LETTERS, 1992, 69 (01) :100-103

[5] SCANNING TUNNELING MICROSCOPY OBSERVATION OF SELF-AFFINE FRACTAL ROUGHNESS IN ION-BOMBARDED FILM SURFACES [J].

KRIM, J ;

HEYVAERT, I ;

VANHAESENDONCK, C ;

BRUYNSERAEDE, Y .

PHYSICAL REVIEW LETTERS, 1993, 70 (01) :57-60

[6]

MANDELBROT BB, 1982, FRAACTAL GEOMETRY NA

[7] QUANTITATIVE TOPOGRAPHIC ANALYSIS OF FRACTAL SURFACES BY SCANNING TUNNELING MICROSCOPY [J].

MITCHELL, MW ;

BONNELL, DA .

JOURNAL OF MATERIALS RESEARCH, 1990, 5 (10) :2244-2254

[8] SELF-AFFINE FRACTAL INTERFACES FROM IMMISCIBLE DISPLACEMENT IN POROUS-MEDIA [J].

RUBIO, MA ;

EDWARDS, CA ;

DOUGHERTY, A ;

GOLLUB, JP .

PHYSICAL REVIEW LETTERS, 1989, 63 (16) :1685-1688

[9] A MOLECULAR-DYNAMICS SIMULATION OF LIQUID VAPOR INTERFACES IN 2 DIMENSIONS [J].

SIKKENK, JH ;

HILHORST, HJ ;

BAKKER, AF .

PHYSICA A, 1985, 131 (03) :587-598

[10] SIMULATION OF A LIQUID VAPOR INTERFACE IN AN EXTERNAL-FIELD [J].

SIKKENK, JH ;

VANLEEUWEN, JMJ ;

VOSSNACK, EO ;

BAKKER, AF .

PHYSICA A, 1987, 146 (03) :622-633

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