SUB-NYQUIST INTERFEROMETRY

[1] BARRATT KH, 1979, IBA TECH REV, V12, P3

[2] COMPARISON OF TECHNIQUES FOR MEASURING THE ROUGHNESS OF OPTICAL-SURFACES [J]. OPTICAL ENGINEERING, 1985, 24 (03) : 380 - 387

[3] Bruning J.H., 1978, OPTICAL SHOP TESTING, P409

[4] 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J]. APPLIED OPTICS, 1984, 23 (24) : 4539 - 4543

[5] Creath K., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V645, P101, DOI 10.1117/12.964494

[6] CONTOURING ASPHERIC SURFACES USING 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J]. OPTICA ACTA, 1985, 32 (12): : 1455 - 1464

[7] Gaskill J. D., 1978, LINEAR SYSTEMS FOURI, P266

[8] GENERALIZED DATA REDUCTION FOR HETERODYNE INTERFEROMETRY [J]. OPTICAL ENGINEERING, 1984, 23 (04) : 350 - 352

[9] HARIHARAN P, 1985, OPTICAL INTERFEROMET, P151

[10] ROUGH-SURFACE INTERFEROMETRY AT 10.6-MU-M [J]. APPLIED OPTICS, 1980, 19 (11): : 1862 - 1869

[1] BARRATT KH, 1979, IBA TECH REV, V12, P3

[2] COMPARISON OF TECHNIQUES FOR MEASURING THE ROUGHNESS OF OPTICAL-SURFACES [J]. OPTICAL ENGINEERING, 1985, 24 (03) : 380 - 387

[3] Bruning J.H., 1978, OPTICAL SHOP TESTING, P409

[4] 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J]. APPLIED OPTICS, 1984, 23 (24) : 4539 - 4543

[5] Creath K., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V645, P101, DOI 10.1117/12.964494

[6] CONTOURING ASPHERIC SURFACES USING 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J]. OPTICA ACTA, 1985, 32 (12): : 1455 - 1464

[7] Gaskill J. D., 1978, LINEAR SYSTEMS FOURI, P266

[8] GENERALIZED DATA REDUCTION FOR HETERODYNE INTERFEROMETRY [J]. OPTICAL ENGINEERING, 1984, 23 (04) : 350 - 352

[9] HARIHARAN P, 1985, OPTICAL INTERFEROMET, P151

[10] ROUGH-SURFACE INTERFEROMETRY AT 10.6-MU-M [J]. APPLIED OPTICS, 1980, 19 (11): : 1862 - 1869