ELEMENTARY CHEMICAL-REACTION PROCESSES ON SILICON SURFACES

被引:33
作者
YOSHINOBU, J
TANAKA, S
NISHIJIMA, M
机构
[1] INST MOLEC SCI, OKAZAKI 444, JAPAN
[2] KYOTO UNIV, FAC SCI, DEPT CHEM, SAKYO KU, KYOTO 606, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1993年 / 32卷 / 3A期
关键词
SILICON; SURFACE REACTION; ADSORPTION; DISSOCIATION; DESORPTION; HYDROGEN; OXYGEN; NITROGEN; AMMONIA; ACETYLENE; HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; SCANNING TUNNELING MICROSCOPE;
D O I
10.1143/JJAP.32.1171
中图分类号
O59 [应用物理学];
学科分类号
摘要
Studies of the elementary chemical-reaction processes of atoms and molecules on Si surfaces, which have been performed mainly by the authors using high-resolution electron energy loss spectroscopy, are reviewed. The adsorbed states, adsorbed sites and adsorbed structures of atoms and molecules, in particular of H, O2, NH3, N and C2H2, and thermal decomposition processes of these adsorbates are discussed in detail. Recent studies utilizing scanning tunneling microscope and lasers, and trends in Si-gas reaction studies are also reviewed.
引用
收藏
页码:1171 / 1181
页数:11
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