JUST-ON-SURFACE MAGNETIC FORCE MICROSCOPY

被引：9

作者：

HOSAKA, S ^{[1
]}

KIKUKAWA, A ^{[1
]}

HONDA, Y ^{[1
]}

HASEGAWA, T ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN

来源：

APPLIED PHYSICS LETTERS | 1994年 / 65卷 / 26期

关键词：

D O I：

10.1063/1.112987

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We propose a just-on-surface magnetic force microscope (JS-MFM) for advanced spatial resolution of magnetic stray field image. In this letter, we describe that the JS-MFM provides better resolution of the stray field image than that in conventional magnetic force microscope, theoretically and experimentally. In the rough estimations, magnetic stray field image just on the surface provides higher resolution of less than 10 nm. In the experiments, initial results demonstrate that JS-MFM can observe a localized surface magnetic stray field caused by small magnetizations in the perpendicularly recorded magnetic domains with a high resolution of around 10 nm. © 1994 American Institute of Physics.

引用

收藏

页码：3407 / 3409

页数：3

相关论文

共 12 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] PREPARATION OF MAGNETIC TIPS FOR A SCANNING FORCE MICROSCOPE [J].

DENBOEF, AJ .

APPLIED PHYSICS LETTERS, 1990, 56 (20) :2045-2047

[3]

GRUTTER P, 1988, J VAC SCI TECHNOL A, V6, P279, DOI 10.1116/1.575425

[4] RECORDED MAGNETIZATION PATTERNS OF HIGHLY C-AXIS ORIENTED CO-CR FILM OBSERVED BY ELECTRON HOLOGRAPHY [J].

HONDA, Y ;

FUTAMOTO, M ;

HASEGAWA, S ;

KAWASAKI, T ;

KUGIYA, F ;

KOIZUWI, M ;

YOSHIDA, K ;

TONOMURA, A .

JOURNAL DE PHYSIQUE, 1988, 49 (C-8) :1969-1970

[5] SIMULTANEOUS OBSERVATION OF 3-DIMENSIONAL MAGNETIC STRAY FIELD AND SURFACE-STRUCTURE USING NEW FORCE MICROSCOPE [J].

HOSAKA, S ;

KIKUKAWA, A ;

HONDA, Y ;

KOYANAGI, H ;

TANAKA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (7A) :L904-L907

[6] STUDY OF MAGNETIC STRAY FIELD MEASUREMENT ON SURFACE USING NEW FORCE MICROSCOPE [J].

HOSAKA, S ;

KIKUKAWA, A ;

HONDA, Y ;

KOYANAGI, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (7A) :L908-L911

[7] MAGNETIC FORCE MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].

KIKUKAWA, A ;

HOSAKA, S ;

HONDA, Y ;

KOYANAGI, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (06) :3092-3098

[8] MAGNETIC FORCE MICROSCOPY OF THIN PERMALLOY-FILMS [J].

MAMIN, HJ ;

RUGAR, D ;

STERN, JE ;

FONTANA, RE ;

KASIRAJ, P .

APPLIED PHYSICS LETTERS, 1989, 55 (03) :318-320

[9] FORCE MICROSCOPY OF MAGNETIZATION PATTERNS IN LONGITUDINAL RECORDING MEDIA [J].

MAMIN, HJ ;

RUGAR, D ;

STERN, JE ;

TERRIS, BD ;

LAMBERT, SE .

APPLIED PHYSICS LETTERS, 1988, 53 (16) :1563-1565

[10] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY [J].

MARTIN, Y ;

RUGAR, D ;

WICKRAMASINGHE, HK .

APPLIED PHYSICS LETTERS, 1988, 52 (03) :244-246