COMPREHENSIVE INTERFEROMETRIC CHARACTERIZATION OF RED AND NEAR-INFRARED EMISSIONS OF C, H, N, O, F, CL, BR, I, P, S, AND SI IN A 370-W MICROWAVE-INDUCED HELIUM PLASMA

被引:18
作者
PIVONKA, DE [1 ]
SCHLEISMAN, AJJ [1 ]
FATELEY, WG [1 ]
FRY, RC [1 ]
机构
[1] KANSAS STATE UNIV AGR & APPL SCI,DEPT CHEM,WILLARD HALL,MANHATTAN,KS 66506
关键词
D O I
10.1366/0003702864508340
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:766 / 772
页数:7
相关论文
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