DETECTION OF EXCESS CRYSTALLINE AS IN GAAS - NATIVE OXIDE OVERLAYERS BY RAMAN-SCATTERING

被引：4

作者：

JAIN, M ^{[1
]}

DATTA, G ^{[1
]}

VENKATARAMAN, P ^{[1
]}

ABBI, SC ^{[1
]}

JAIN, KP ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT THEORET PHYS,OXFORD OX1 3NP,ENGLAND

来源：

PRAMANA | 1989年 / 32卷 / 05期

关键词：

D O I：

10.1007/BF02847388

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：641 / 646

页数：6

共 16 条

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[7] RAMAN-SCATTERING PROPERTIES OF AMORPHOUS AS AND SB [J].

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[8] IN-DEPTH PROFILES OF OXIDE-FILMS ON GAAS STUDIED BY XPS [J].

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[10]

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