CHARACTERIZATION OF CARBIDES BY SCANNING TUNNELING MICROSCOPY

被引：8

作者：

BONNELL, DA

机构：

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1988年 / 105卷

关键词：

D O I：

10.1016/0025-5416(88)90480-6

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：55 / 63

页数：9

共 13 条

[1] SCANNING TUNNELING MICROSCOPY - FROM BIRTH TO ADOLESCENCE
BINNIG, G
ROHRER, H
[J]. REVIEWS OF MODERN PHYSICS, 1987, 59 (03) : 615 - 625
[2] SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY OF CERAMICS - SILICON-CARBIDE AND ZINC-OXIDE
BONNELL, DA
CLARKE, DR
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1988, 71 (08) : 629 - 637
[3] TUNNELING SPECTROSCOPY OF THE GAAS(110) SURFACE
FEENSTRA, RM
STROSCIO, JA
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04): : 923 - 929
[4] TUNNELING SPECTROSCOPY OF THE SI(111)2X1 SURFACE
FEENSTRA, RM
STROSCIO, JA
FEIN, AP
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 295 - 306
[5] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF INTERFACES AND SURFACES
GIBSON, JM
MCDONALD, ML
BATSTONE, JL
PHILLIPS, JM
[J]. ULTRAMICROSCOPY, 1987, 22 (1-4) : 35 - 46
[6] ELECTRONIC AND GEOMETRIC STRUCTURE OF SI(111)-(7X7) AND SI(001) SURFACES
HAMERS, RJ
TROMP, RM
DEMUTH, JE
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 346 - 355
[7] SCANNING TUNNELING MICROSCOPY
HANSMA, PK
TERSOFF, J
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : R1 - R23
[8] EXPERIMENTAL STUDIES OF ATOMIC STEP CONTRAST IN REFLECTION ELECTRON-MICROSCOPY (REM)
HSU, T
PENG, LM
[J]. ULTRAMICROSCOPY, 1987, 22 (1-4) : 217 - 224
[9] IMPORTANCE OF GEOMETRY, FIELD, AND TEMPERATURE IN TUNNELING AND RECTIFICATION BEHAVIOR OF POINT CONTACT JUNCTIONS OF IDENTICAL METALS
MISKOVSKY, NM
SHEPHERD, SJ
CUTLER, PH
SULLIVAN, TE
LUCAS, AA
[J]. APPLIED PHYSICS LETTERS, 1979, 35 (07) : 560 - 562
[10] Precht W., 1968, Journal of Crystal Growth, V3-4Spe, P818, DOI 10.1016/0022-0248(68)90274-1

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