HIGH-RESOLUTION ELECTRON-MICROSCOPY OF INTERFACES AND SURFACES

[1] THEORETICAL-STUDY OF THE ATOMIC-STRUCTURE OF SILICON (211), (311), AND (331) SURFACES [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 785 - 792

[2] UNIQUENESS OF SURFACE IMAGES [J]. PHYSICAL REVIEW LETTERS, 1984, 53 (19) : 1859 - 1859

[3] GIBSON JM, 1982, APPL PHYS LETT, V41, P818, DOI 10.1063/1.93699

[4] HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES BETWEEN EPITAXIAL THIN FILMS AND SEMICONDUCTORS. [J]. Ultramicroscopy, 1984, 14 (1-2) : 1 - 10

[5] DIRECT IMAGING OF A NOVEL SILICON SURFACE RECONSTRUCTION [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (17) : 1765 - 1767

[6] GIBSON JM, 1985, IEEE SPECTRUM DEC, P38

[7] GIBSON JM, 1985, I PHYS C SER, V76, P173

[8] HULL R, 1985, MAT RES SOC S P, V37, P261

[9] ISHIZAKA A, 1982, 2ND P INT S MOL BEAM, P183

[10] POSSIBILITY OF DIRECT IMAGING OF POINT-DEFECTS IN CRYSTALS USING TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1977, 35 (03): : 575 - 592

[1] THEORETICAL-STUDY OF THE ATOMIC-STRUCTURE OF SILICON (211), (311), AND (331) SURFACES [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 785 - 792

[2] UNIQUENESS OF SURFACE IMAGES [J]. PHYSICAL REVIEW LETTERS, 1984, 53 (19) : 1859 - 1859

[3] GIBSON JM, 1982, APPL PHYS LETT, V41, P818, DOI 10.1063/1.93699

[4] HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES BETWEEN EPITAXIAL THIN FILMS AND SEMICONDUCTORS. [J]. Ultramicroscopy, 1984, 14 (1-2) : 1 - 10

[5] DIRECT IMAGING OF A NOVEL SILICON SURFACE RECONSTRUCTION [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (17) : 1765 - 1767

[6] GIBSON JM, 1985, IEEE SPECTRUM DEC, P38

[7] GIBSON JM, 1985, I PHYS C SER, V76, P173

[8] HULL R, 1985, MAT RES SOC S P, V37, P261

[9] ISHIZAKA A, 1982, 2ND P INT S MOL BEAM, P183

[10] POSSIBILITY OF DIRECT IMAGING OF POINT-DEFECTS IN CRYSTALS USING TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1977, 35 (03): : 575 - 592