LASER PHOTOELECTRON SPECTROMETRY MEASUREMENT OF CHARACTERISTIC ELECTRONIC AND VIBRATIONAL TEMPERATURES OF SPUTTERED NEGATIVE-IONS

被引：23

作者：

CORDERMAN, RR ^{[1
]}

ENGELKING, PC ^{[1
]}

LINEBERGER, WC ^{[1
]}

机构：

[1] UNIV COLORADO,NBS,JOINT INST LAB ASTROPHYS,DEPT CHEM,BOULDER,CO 80302

来源：

APPLIED PHYSICS LETTERS | 1980年 / 36卷 / 07期

关键词：

D O I：

10.1063/1.91569

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：533 / 535

页数：3

共 20 条

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ANDERSEN, CA
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[3] SPUTTERING AND ION-SOURCE TECHNOLOGY
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[4] NEGATIVE-ION SPECTROSCOPY
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[5] UNIFIED EXPLANATION FOR SECONDARY ION YIELDS
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EVANS, CA
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[J]. APPLIED PHYSICS LETTERS, 1978, 33 (07) : 578 - 580
[6] ENERGY-DISTRIBUTION OF NEGATIVE-IONS SPUTTERED FROM CESIATED SURFACES
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[7] LASER PHOTOELECTRON SPECTROMETRY OF FEO - ELECTRON-AFFINITY, ELECTRONIC STATE SEPARATIONS, AND GROUND-STATE VIBRATIONS OF IRON-OXIDE, AND A NEW GROUND-STATE ASSIGNMENT
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[J]. JOURNAL OF CHEMICAL PHYSICS, 1977, 66 (11) : 5054 - 5058
[8] FORMATION OF SMALL METAL CLUSTERS BY ION-BOMBARDMENT OF SINGLE-CRYSTAL SURFACES
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HARRISON, DE
[J]. JOURNAL OF CHEMICAL PHYSICS, 1978, 69 (04) : 1440 - 1444
[9] Hotop H., 1975, Journal of Physical and Chemical Reference Data, V4, P539, DOI 10.1063/1.555524
[10] ATTEMPT TO UNDERSTAND SECONDARY PHOTON EMISSION
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GOODZAMIN, CJ
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SQUIRES, DB
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 563 - 566

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